Semiconductor devices. Flexible and stretchable semiconductor devices Bending test method for conductive thin films on flexible substrates
€183.00
LED modules for general lighting. Safety specifications
€269.00
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
€193.00
Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Arbitrary random mechanical vibrations
€316.00
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using optical inspection
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies light diodes
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on temperature-dependent electroluminescence
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on room-temperature reference point
Semiconductor devices. devices for energy harvesting and generation Test evaluation methods vertical contact mode triboelectric
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control selection
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
Semiconductor die products Recommendations for good practice in handling, packing and storage
€355.00
Semiconductor die products Exchange data formats
€404.00
Semiconductor devices sensors. Pressure sensors
