Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
€627.00
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters
€286.00
BS EN IEC 63601 Guideline for Evaluating Bias Temperature Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion (Fast track)
€23.00
BS EN IEC 63602 Guidelines for Representing Switching Losses of SIC MOSFETs in Datasheets (Fast track)
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on thermoreflectance
€269.00
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor
BS EN IEC 62047-53 Semiconductor devices. Micro-electromechanical devices Part 53. MEMS electrothermal transfer device
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
BS EN IEC 63550-4 Semiconductor devices. Neuromorphic devices Evaluation method of asymmetry in neuromorphic memristor
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic Part 1: Evaluation method of basic characteristics in memristor
BS EN IEC 63550-2 Semiconductor devices - Neuromorphic Part 2: Evaluation method of linearity in memristor
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength microstructures
€193.00
Semiconductor devices - Micro-electromechanical devices - Part 47: Silicon based MEMS fabrication technology - Measurement method of bending strength of microstructures
€88.00
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods detection performance for LiDAR
