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24/30505492 DC:2024
BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/22/2024 |
| Page Count | 20 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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01/04/1996
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08/08/2024
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