Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
€58.00
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Withdrawn 2023)
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Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness (Withdrawn 2020)
Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications (Withdrawn 2020)
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) (Withdrawn 2022)
Printed electronics Materials. Semiconductor ink
€269.00
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
€183.00
Exposure to electric or magnetic fields in the low and intermediate frequency range. Methods for calculating current density internal field induced human body 2D models
€374.00
Semiconductor converters. General requirements and line commutated converters Specification of basic
€404.00
Semiconductor converters. General requirements and line commutated converters Application guide
Printed electronics Materials. Semiconductor ink. Space charge limited mobility measurement in printed organic semiconductive layers
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length
€193.00
BS EN IEC 60146-1-1. Semiconductor converters. General requirements and line commutated converters Part 1-1. Specification of basic
€23.00
BS IEC 62899-203-2 Printed electronics Materials - Semiconductor Ink- Space charge limited mobility measurement in printed organic semiconductive layers
