DIN EN 62047-13:2012-10

DIN EN 62047-13:2012-10

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Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (IEC 62047-13:2012); German version EN 62047-13:2012

€98.32

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UNE-EN 60512-1-100:2012

UNE-EN 60512-1-100:2012

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Connectors for electronic equipment - Tests and measurements - Part 1-100: General - Applicable publications

€61.00

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DIN EN 60512-1-4 Berichtigung 1:2012-07

DIN EN 60512-1-4 Berichtigung 1:2012-07

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Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General - Section 4: Test 1d: Contact protection effectiveness (scoop-proof) (IEC 60512-1-4:1997); German version EN 60512-1-4:1997, Corrigendum to DIN EN 60512-1-4:1998-02; (IEC-Cor. :2000 to IEC 60512-1-4:1997)

€0.00

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DIN EN 62047-12:2012-06

DIN EN 62047-12:2012-06

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Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (IEC 62047-12:2011); German version EN 62047-12:2011

€116.64

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BS EN 60512-9-2:2012

BS EN 60512-9-2:2012

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Connectors for electronic equipment. Tests and measurements Endurance tests. Test 9b. Electrical load temperature

€165.00

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DIN EN 62047-5:2012-03

DIN EN 62047-5:2012-03

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Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches (IEC 62047-5:2011); German version EN 62047-5:2011

€128.22

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DIN EN 62047-9:2012-03

DIN EN 62047-9:2012-03

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Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 62047-9:2011); German version EN 62047-9:2011

€111.40

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DIN EN 62047-10:2012-03

DIN EN 62047-10:2012-03

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Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (IEC 62047-10:2011); German version EN 62047-10:2011

€84.58

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BS EN 60512-7-2:2012

BS EN 60512-7-2:2012

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Connectors for electronic equipment. Tests and measurements Impact tests (free connectors). Test 7b. Mechanical strength impact

€165.00

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DIN EN 62047-7:2012-02

DIN EN 62047-7:2012-02

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Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (IEC 62047-7:2011); German version EN 62047-7:2011

€116.64

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DIN EN 62047-8:2011-12

DIN EN 62047-8:2011-12

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Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011); German version EN 62047-8:2011

€98.32

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IEC 60512-9-2:2011

IEC 60512-9-2:2011

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Connectors for electronic equipment - Tests and measurements - Part 9-2: Endurance tests - Test 9b: Electrical load and temperature

€22.00

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IEC 60512-7-2:2011

IEC 60512-7-2:2011

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Connectors for electronic equipment - Tests and measurements - Part 7-2: Impact tests (free components) - Test 7b: Mechanical strength impact

€22.00

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BS EN 60512-9-3:2011

BS EN 60512-9-3:2011

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Connectors for electronic equipment. Tests and measurements Endurance tests. Test 9c. Mechanical operation (engaging/separating) with electrical load

€165.00

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BS EN 60512-8-2:2011

BS EN 60512-8-2:2011

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Connectors for electronic equipment. Tests and measurements Static load tests (fixed connectors). Test 8b. load, axial

€165.00

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