UNE-EN 50625-2-1:2015

UNE-EN 50625-2-1:2015

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Collection, logistics and treatment requirements for WEEE - Part 2-1: Treatment requirements for lamps

€70.00

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DIN EN 62047-21:2015-04

DIN EN 62047-21:2015-04

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Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials (IEC 62047-21:2014); German version EN 62047-21:2014

€91.03

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DIN EN 62047-22:2015-04

DIN EN 62047-22:2015-04

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Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014); German version EN 62047-22:2014

€77.20

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PD CLC/TS 50625-3-1:2015

PD CLC/TS 50625-3-1:2015

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Collection, logistics & treatment requirements for WEEE Specification de-pollution. General

€269.00

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BS EN 50625-2-1:2014

BS EN 50625-2-1:2014

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Collection, logistics and treatment requirements for WEEE Treatment lamps

€269.00

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CLC/TS 50625-3-1, W20-014 (01/2015)

CLC/TS 50625-3-1, W20-014 (01/2015)

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Exigences de collecte, logistique et traitement pour les DEEE - Partie 3-1: Spécifications relatives à la dépollution - Généralités

€78.50

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UNE-EN 50625-1:2014 (R2019)

UNE-EN 50625-1:2014 (R2019)

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Collection, logistics & Treatment requirements for WEEE - Part 1: General treatment requirements

€88.00

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NF EN 50625-1, C05-625-1 (07/2014)

NF EN 50625-1, C05-625-1 (07/2014)

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Collection, logistic and treatment requirements for WEEE - Part 1 : general treatment requirements

€69.00

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DIN EN 62047-11:2014-04

DIN EN 62047-11:2014-04

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Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems (IEC 62047-11:2013); German version EN 62047-11:2013

€105.42

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DIN EN 62047-18:2014-04

DIN EN 62047-18:2014-04

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Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (IEC 62047-18:2013); German version EN 62047-18:2013

€91.03

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DIN EN 62047-19:2014-04

DIN EN 62047-19:2014-04

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Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (IEC 62047-19:2013); German version EN 62047-19:2013

€116.64

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BS EN 50625-1:2014

BS EN 50625-1:2014

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Collection, logistics & Treatment requirements for WEEE General treatment

€316.00

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NF EN 60512-24-1, C93-400-24-1 (04/2013)

NF EN 60512-24-1, C93-400-24-1 (04/2013)

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Connectors for electronic equipment - Tests and measurements - Part 24-1 : magnetic interference tests - Test 24a : residual magnetism - Connecteurs pour équipements électroniques

€43.67

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BS EN 60512-24-1:2012

BS EN 60512-24-1:2012

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Connectors for electronic equipment. Tests and measurements Magnetic interference tests. Test 24a: Residual magnetism

€165.00

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DIN EN 62047-14:2012-10

DIN EN 62047-14:2012-10

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Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (IEC 62047-14:2012); German version EN 62047-14:2012

€98.32

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