BS EN IEC 60512-8-3:2018

BS EN IEC 60512-8-3:2018

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Connectors for electrical and electronic equipment. Tests measurements Static load tests (fixed connectors). Test 8c: Robustness of actuating lever

€193.00

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BS EN IEC 61076-2-111:2018

BS EN IEC 61076-2-111:2018

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Connectors for electrical and electronic equipment. Product requirements Circular connectors. Detail specification power connectors with M12 screw-locking

€404.00

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IEEE 2700:2017

IEEE 2700:2017

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IEEE Standard for Sensor Performance Parameter Definitions

€80.00

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IEC 60512-8-3:2018

IEC 60512-8-3:2018

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Connectors for electrical and electronic equipment - Tests and measurements - Part 8-3: Static load tests (fixed connectors) - Test 8c: Robustness of actuating lever

€44.00

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NF EN 50625-2-4, C05-625-2-4 (11/2017)

NF EN 50625-2-4, C05-625-2-4 (11/2017)

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Collection, logistics & treatment requirements for WEEE - Part 2-4 : treatment requirements for photovoltaic panels

€111.67

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PD CLC/TS 50625-4:2017

PD CLC/TS 50625-4:2017

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Collection, logistics & treatment requirements for WEEE Specification the collection and associated with

€193.00

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CLC/TS 50625-4, W20-014-4 (06/2017)

CLC/TS 50625-4, W20-014-4 (06/2017)

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Collection, logistics & treatment requirements for WEEE - Part 4 : Specification for the collection and logistics associated with WEEE

€56.47

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DIN EN 62047-25:2017-04

DIN EN 62047-25:2017-04

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Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area (IEC 62047-25:2016); German version EN 62047-25:2016

€105.42

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DIN EN 62047-26:2016-12

DIN EN 62047-26:2016-12

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Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (IEC 62047-26:2016); German version EN 62047-26:2016

€116.64

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DIN EN 62047-1:2016-12

DIN EN 62047-1:2016-12

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Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (IEC 62047-1:2016); German version EN 62047-1:2016.

€128.22

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DIN EN 62047-16:2015-12

DIN EN 62047-16:2015-12

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Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods (IEC 62047-16:2015); German version EN 62047-16:2015

€84.58

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DIN EN 62047-17:2015-12

DIN EN 62047-17:2015-12

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Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films (IEC 62047-17:2015); German version EN 62047-17:2015

€111.40

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UNE-EN 50625-2-2:2015

UNE-EN 50625-2-2:2015

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Collection, logistics & Treatment requirements for WEEE - Part 2-2: Treatment requirements for WEEE containing CRTs and flat panel displays

€64.00

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NF EN 50625-2-2, C05-625-2-2 (09/2015)

NF EN 50625-2-2, C05-625-2-2 (09/2015)

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Collection, logistics and treatment requirements for WEEE - Part 2-2 : treatment requirements for WEEE containing CRTs and flat panel displays

€95.67

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NF EN 50625-2-1, C05-625-2-1 (08/2015)

NF EN 50625-2-1, C05-625-2-1 (08/2015)

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Collection, logistics and treatment requirements for WEEE - Part 2-1 : treatment requirements for lamps

€111.67

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