31.200 : Integrated circuits. Microelectronics

BS IEC 60748-23-5:2003

BS IEC 60748-23-5:2003

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Semiconductor devices. Integrated circuits Hybrid integrated and film structures. Manufacturing line certification. Procedure for qualification approval

€269.00

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IEC 60748-23-5:2003

IEC 60748-23-5:2003

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Semiconductor devices - Integrated circuits, Part 23-5: Hybrid integrated circuits and film structures - Manufacturing line certification - Procedure for qualification approval

€286.00

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DIN EN 61967-5:2003-10

DIN EN 61967-5:2003-10

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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions; Workbench Faraday Cage method (IEC 61967-5:2003); German version EN 61967-5:2003.

€98.32

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NF EN 61967-5, C96-260-5 (08/2003)

NF EN 61967-5, C96-260-5 (08/2003)

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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Partie 5 : measurement of conducted emissions, Workbench faraday cage method - Circuits intégrés

€111.67

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BS EN 61967-5:2003

BS EN 61967-5:2003

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Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz conducted emissions. Workbench Faraday Cage method

€269.00

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DIN EN 61523-2:2003-06

DIN EN 61523-2:2003-06

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Delay and power calculation standards - Part 2: Pre-layout delay calculation specification for CMOS ASIC libraries (IEC 61523-2:2002); German version EN 61523-2:2002, text in English

€116.64

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NF EN 61967-6, C96-260-6 (01/2003)

NF EN 61967-6, C96-260-6 (01/2003)

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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz - 1 GHz - Part 6 : measurement of conducted emissions - Magnetic probe method - Circuits intégrés

€111.67

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DIN EN 62014-1:2002-11

DIN EN 62014-1:2002-11

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Electronic design automation libraries - Part 1: Input/output buffer information specifications (IBIS version 3.2) (IEC 62014-1:2001); German version EN 62014-1:2002

€173.74

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DIN EN 61523-1:2002-10

DIN EN 61523-1:2002-10

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Delay and power calculation standards - Part 1: Integrated circuit delay and power calculation systems (IEC 61523-1:2001); German version EN 61523-1:2002, text in English

€342.24

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BS IEC 60748-1:2002

BS IEC 60748-1:2002

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Semiconductor devices. Integrated circuits General

€269.00

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IEC 61967-6:2002

IEC 61967-6:2002

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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

€231.00

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BS IEC 60748-23-2:2002

BS IEC 60748-23-2:2002

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Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Internal visual inspection special tests

€404.00

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BS IEC 60748-23-3:2002

BS IEC 60748-23-3:2002

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Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Manufacturers' self-audit checklist report

€404.00

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BS IEC 60748-23-4:2002

BS IEC 60748-23-4:2002

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Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Blank detail specification

€193.00

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BS IEC 60748-23-1:2002

BS IEC 60748-23-1:2002

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Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Generic specification

€404.00

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