Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
€316.00
Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
€418.00
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation (IEC 62258-5:2006); German version EN 62258-5:2006.
€77.20
Semiconductor die products - Part 6: Requirements for information concerning thermal simulation (IEC 62258-6:2006); German version EN 62258-6:2006.
€63.27
VMEbus Signal Mapping on VPX
€55.00
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method (IEC 62132-4:2006); German version EN 62132-4:2006
€98.32
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4 : direct RF power injection method - Circuits intégrés
€111.67
Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
€286.00
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz Direct RF power injection method
€269.00
Mnemonics and symbols for integrated circuits
€374.00
€176.00
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method (IEC 62132-5:2005); German version EN 62132-5:2006.
Circuits intégrés - Mesure de l'immunité électromagnétique, 150 kHz à 1 GHz - Partie 5 : méthode de la cage de Faraday sur banc de travail
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Workbench Faraday cage method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (IEC 61967-2:2005); German version EN 61967-2:2005
