Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
€176.00
Rear Transition Module for VPX
€55.00
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008.
€122.34
Semiconductor devices. Integrated circuits Digital integrated circuits. Family specification. Low voltage
€193.00
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
€611.00
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6 : measurement of conducted emissions - Magnetic probe method - Circuits intégrés
€95.67
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method (IEC 62132-3:2007); German version EN 62132-3:2007
€105.42
Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
€127.00
Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
Standard testability method for embedded core-based integrated circuits
€404.00
Integrated circuits. Measurement of impulse immunity Synchronous transient injection method
€269.00
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Bulk current injection (BCI) method
Standard Testability Method for Embedded Core-based Integrated Circuits
€473.00
Integrated circuits - Measurement of impulse immunity - Part 2: Synchronous transient injection method
€231.00
Logic digital integrated circuits. Specification for I/O interface model for integrated circuit (IMIC version 1.3)
