31.200 : Integrated circuits. Microelectronics

BS 9450:1998

BS 9450:1998

Superseded Historical

Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test

€404.00

View more
26/30553704 DC:2026

26/30553704 DC:2026

Active Most Recent

Draft BS EN 62433-4 Ed.2.0 EMC IC modelling Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted (ICIM-CI)

€23.00

View more
BS CECC 00013:1985

BS CECC 00013:1985

Withdrawn Most Recent

Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice

€269.00

View more
25/30531426 DC:2025

25/30531426 DC:2025

Active Most Recent

Draft BS EN 63664 Integrated Circuits. Electronic fuses for low voltage automotive power distribution networks

€23.00

View more
PD IEC TR 62433-4-1:2025

PD IEC TR 62433-4-1:2025

Active Most Recent

EMC IC modelling Use of ICIM-CI model to predict the conducted immunity in a PCB

€355.00

View more
BS EN IEC 61967-8:2023

BS EN IEC 61967-8:2023

Active Most Recent

Integrated circuits. Measurement of electromagnetic emissions radiated emissions. IC stripline method

€193.00

View more
IEEE 1687:2014

IEEE 1687:2014

Withdrawn Most Recent

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

€275.00

View more
IEEE 1581:2011

IEEE 1581:2011

Withdrawn Most Recent

IEEE Standard for Static Component Interconnection Test Protocol and Architecture

€106.00

View more
IEEE 1149.1:2013

IEEE 1149.1:2013

Withdrawn Most Recent

IEEE Standard for Test Access Port and Boundary-Scan Architecture

€310.00

View more
IEEE 1804:2017

IEEE 1804:2017

Active Most Recent

IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules

€55.00

View more
IEEE 1241:2010

IEEE 1241:2010

Withdrawn Most Recent

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

€184.00

View more
IEEE 1838:2019

IEEE 1838:2019

Active Most Recent

IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits

€101.00

View more
IEEE 605:2008

IEEE 605:2008

Withdrawn Most Recent

IEEE Guide for Bus Design in Air Insulated Substations

€92.00

View more
IEEE 1149.10:2017

IEEE 1149.10:2017

Active Most Recent

IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture

€101.00

View more
IEEE 2416:2019

IEEE 2416:2019

Active Most Recent

IEEE Standard for Power Modeling to Enable System-Level Analysis

€80.00

View more