Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
€77.67
Circuits intégrés - Mesure des émissions électromagnétiques - Partie 8 : mesure des émissions rayonnées - Méthode de la ligne TEM à plaques (stripline) pour CI
€95.67
Serial RapidIO on VPX Fabric Connector
€55.00
PCIExpress (R) on the VPX Fabric Connector
€27.50
Ethernet on VPX Fabric Connector
Circuits intégrés - Mesure de l'immunité électromagnétique - Partie 2 : mesure de l'immunité rayonnée - Méthode de cellule TEM et cellule TEM à large bande
€93.67
Semiconductor devices Generic specification for discrete and integrated circuits
€316.00
Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated excluding hybrid
€269.00
Integrated circuits. Measurement of electromagnetic immunity radiated immunity. TEM cell and wideband method
EMC IC modelling Theory of black box for conducted emission
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:2008-10; (IEC-Cor. :2010 to IEC 61967-6:2002)
€0.00
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz conducted emissions. Magnetic probe method
€355.00
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
€63.27
EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission
€231.00
Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
