Integrated circuits - Measurement of electromagnetic immunity, 150 KHz to 1 GHz - Part 3 : Bulk Current Injection (BCI) method - Circuits intégrés
€103.00
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1 : general conditions and definitions - Circuits intégrés
€87.39
Harmonized system of quality assessment for electronic components integrated voltage regulators. Bank detail specification
€95.67
Semiconductors devices. Integrated circuits. Part 11 : sectional specification for semiconducteur integrated circuits excluding hybrid circuits - Dispositifs à semiconducteurs - Circuits intégrés
€126.00
Integrated circuits - Measurement of electromagnetic emissions - Part 1 : general conditions and definitions
€116.33
EMC IC modelling - Part 1 : general modelling framework
€175.33
Integrated circuits - EMC evaluation of transceivers - Part 3 : CAN transceivers - Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 3 : Émetteurs-récepteurs CAN
€188.67
Integrated circuits - EMC evaluation of transceivers - Part 1 : general conditions and definitions
€88.00
EMC IC modelling - Part 6 : models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI) - Modèles de circuits intégrés pour la CEM - Partie 6 : Modèles de circuits intégrés pour la simulation du comportement d'immunité aux impulsions - Modélisation de l'immunité aux impulsions conduite (ICIMCPI)
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation (IEC 62258-5:2006); German version EN 62258-5:2006.
€77.20
Semiconductor die products - Part 6: Requirements for information concerning thermal simulation (IEC 62258-6:2006); German version EN 62258-6:2006.
€63.27
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions (IEC 62132-1:2006); German version EN 62132-1:2006, Corrigenda to DIN EN 62132-1:2006-06; CENELEC-Corrigendum November 2006 to EN 62132-1:2006.
€0.00
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions 1 ohm/150 ohm direct coupling method (IEC 61967-4:2002 + A1:2006); German version EN 61967-4:2002 + A1:2006, Corrigenda to DIN EN 61967-4:2006-07; CENELEC-Corrigendum December 2006 to EN 61967-4:2002/A1:2006.
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method (IEC 62132-3:2007); German version EN 62132-3:2007
€105.42
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008.
€122.34
