31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
BS EN 60068-2-77:1999

BS EN 60068-2-77:1999

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Environmental testing. Test methods Body strength and impact shock

€193.00

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BS EN 61223-3-1:1999

BS EN 61223-3-1:1999

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Evaluation and routine testing in medical imaging departments Acceptance tests Imaging performance of X-ray equipment for radiographic radiscopic systems

€374.00

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IEC 60191-2W:1999

IEC 60191-2W:1999

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Twenty-first supplement

€88.00

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IEC 60821:1991/AMD1:1999

IEC 60821:1991/AMD1:1999

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Amendment 1 - VMEbus - Microprocessor system bus for 1 byte to 4 byte data

€44.00

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DIN EN 153000:1999-01

DIN EN 153000:1999-01

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Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval); German version EN 153000:1998

€98.32

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IEC 60191-2V:1998

IEC 60191-2V:1998

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Twentieth supplement

€44.00

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BS EN 153000:1998

BS EN 153000:1998

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Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)

€269.00

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BS 3934-5:1997

BS 3934-5:1997

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Mechanical standardization of semiconductor devices Recommendations applying to tape automated bonding (TAB) integrated circuits

€316.00

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DIN EN 60617-5:1997-08

DIN EN 60617-5:1997-08

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Graphical symbols for diagrams - Part 5: Semiconductors and electron tubes (IEC 60617-5:1996); German version EN 60617-5:1996

€134.02

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IEC 60191-2U:1997

IEC 60191-2U:1997

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Nineteenth supplement

€22.00

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IEC 60191-5:1997

IEC 60191-5:1997

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Mechanical standardization of semiconductor devices - Part 5: Recommendations applying to integrated circuit packages using tape automated bonding (TAB)

€286.00

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IEC 60191-2T:1996

IEC 60191-2T:1996

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Eighteenth supplement

€11.00

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BS QC 750114:1996

BS QC 750114:1996

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Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications

€193.00

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ASTM E431-96(2022)

ASTM E431-96(2022)

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Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

€65.00

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DIN EN 120003:1996-11

DIN EN 120003:1996-11

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Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992

€56.17

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