Semiconductor devices; internal visual examination; procedure for discrete semiconductors; identical with IEC 47(Central Office)1053-II
€77.20
Binary floating-point arithmetic for microprocessor systems
€176.00
Standard Specification for Semiconductor Device Passivation Opening Layouts (Withdrawn 2007)
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Semiconductor devices; measuring method of transition time for snap-off- diodes; identical with IEC 47(Central Office)1041
€34.30
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz
€193.00
Semiconductor devices; internal visual examination; procedure for discrete semiconductors; identical with IEC 47(Central Office)1053
€56.17
Semiconductor devices; measuring methods for matched-pair bipolar transistors; identical with IEC 47(Central Office)1042
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: varactor diodes for frequency multiplication
€165.00
Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
€446.00
Semiconductor devices; measuring methods for recovered charge of rectifier diodes and thyristors; identical with IEC 47(Central Office)1075
€41.78
Semiconducteurs - Transistors à effet de champ en hyperfréquences - Prescriptions provisoires
€179.00
IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
€107.00
Semiconductor devices; term and letter symbol for leakage current; identical with IEC 47(Central Office)1073
Semiconductor devices; revised definition of "forward recovery time" for rectifier diodes and signal diodes; identical with IEC 47(Central Office)1076
Dispositifs hyperfréquences - Relais et commutateurs électromécaniques coaxiaux et en guides d'ondes
€138.00
