Amendment 1 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
€22.00
Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
€269.00
Semiconductor die products EXPRESS model schema for data exchange
Semiconductor die products Recommendations for good practice in handling, packing and storage
€355.00
Semiconductor die products - Part 8: EXPRESS model schema for data exchange
€231.00
Semiconductor die products XML schema for data exchange
Semiconductor die products - Part 7: XML schema for data exchange
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
€176.00
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
€781.00
Varnishes used for electrical insulation Methods of test
Amendment 1 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
€127.00
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
€165.00
Semiconductor die products Requirements for information concerning electrical simulation
€193.00
Semiconductor die products Requirements for information concerning thermal simulation
