31.080.99 : Other semiconductor devices

IEC 60747-16-9:2024

IEC 60747-16-9:2024

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IEC 60747-16-9:2024 Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters

€302.00

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IEC 60747-15:2024

IEC 60747-15:2024

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IEC 60747-15:2024 Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices

€389.00

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DIN IEC 47E/131/CDV:2000-01

DIN IEC 47E/131/CDV:2000-01

Superseded Historical

IEC 60747-4: Terminology, essential ratings and characteristics and measuring methods for integrated circuit microwave power amplifiers (IEC 47E/131/CDV:1999)

€63.27

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DIN IEC 47E/132/CDV:2000-01

DIN IEC 47E/132/CDV:2000-01

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IEC 60747-14-3: Discrete seminconductor devices - Part 14-3: Semiconductor pressure sensors (IEC 47E/132/CDV:1999)

€69.91

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DIN IEC 60747-16-4:2001-07

DIN IEC 60747-16-4:2001-07

Superseded Historical

Discrete semiconductor devices - Part 16-4: Terminology, essential ratings and characteristics, and measuring methods for integrated circuit microwave switches (IEC 47E/185/CD:2001)

€111.40

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26/30544420 DC:2026

26/30544420 DC:2026

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BS EN IEC 62047-58 Semiconductor devices - Micro-electromechanical systems Part 58: Test methods for performances of MEMS thermopile

€23.00

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24/30505492 DC:2024

24/30505492 DC:2024

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BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices

€23.00

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24/30499009 DC:2024

24/30499009 DC:2024

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BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification

€23.00

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24/30499092 DC:2024

24/30499092 DC:2024

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BS EN IEC 63601 Guideline for Evaluating Bias Temperature Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion (Fast track)

€23.00

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24/30499096 DC:2024

24/30499096 DC:2024

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BS EN IEC 63602 Guidelines for Representing Switching Losses of SIC MOSFETs in Datasheets (Fast track)

€23.00

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24/30499668 DC:2024

24/30499668 DC:2024

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BS EN IEC 63550-1 Semiconductor devices - Neuromorphic Part 1: Evaluation method of basic characteristics in memristor

€23.00

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24/30499672 DC:2024

24/30499672 DC:2024

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BS EN IEC 63550-2 Semiconductor devices - Neuromorphic Part 2: Evaluation method of linearity in memristor

€23.00

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26/30543279 DC:2025

26/30543279 DC:2025

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BS EN IEC 62047-57 Micro-electromechanical systems Part 57: RF MEMS directional coupler

€23.00

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25/30507934 DC:2025

25/30507934 DC:2025

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BS EN IEC 60747-5-19 Semiconductor devices Part 5-19: Optoelectronic - Light emitting diodes Test method of the micro photoluminescence for chip wafers light

€23.00

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25/30508761 DC:2025

25/30508761 DC:2025

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BS EN IEC 60747-5-13/AMD1 Amendment 1 - Semiconductor devices Part 5-13: Optoelectronic Hydrogen sulphide corrosion test for LED packages

€23.00

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