Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
€231.00
Semiconductor die products - Part 2: Exchange data formats
€418.00
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
€451.00
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
€127.00
Hand-held motor-operated electric tools. Safety General requirements
€404.00
Semiconductor die products Procurement and use
€355.00
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
€269.00
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
€88.00
Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage
€369.00
Semiconductor devices. Micro-electromechanical devices Axial fatigue testing methods of thin film materials
€193.00
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
€528.00
Semiconductor devices sensors. Pressure sensors
Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
Semiconductor die products - Part 1: Procurement and use
€325.00
