Semiconductor devices - Micro-electromechanical devices - Part 13: Bend - and shear - type test methods of measuring adhesive strength for MEMS structures
€88.00
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
€127.00
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 7 : filtre et duplexeur BAW MEMS pour la commande et le choix des fréquences radioélectriques
€111.67
Semiconductor die products - Part 2 : exchange data formats
€184.00
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration MEMS structures
€316.00
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 8 : méthode d'essai de la flexion de bandes en vue de la mesure des propriétés de traction des couches minces
€95.67
Semiconductor devices. Micro-electromechanical devices Micro-pillar compression test for MEMS materials
€193.00
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
€231.00
Semiconductor die products - Part 1 : procurement and use
€117.00
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control selection
Semiconductor die products Exchange data formats
€404.00
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
€44.00
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
€286.00
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
€176.00
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
