31.080.99 : Other semiconductor devices

IEC 62047-1:2016

IEC 62047-1:2016

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Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions

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NF EN 62047-16, C96-050-16 (11/2015)

NF EN 62047-16, C96-050-16 (11/2015)

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Semiconductor devices - Micro-electromechanical devices - Part 16 : test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods

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NF EN 62047-17, C96-050-17 (11/2015)

NF EN 62047-17, C96-050-17 (11/2015)

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Semiconductor devices - Micro-electromechanical devices - Part 17 : bulge test method for measuring mechanical properties of thin films - Dispositifs à semiconducteurs

€126.00

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BS EN 62047-15:2015

BS EN 62047-15:2015

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Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass

€193.00

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BS EN 62047-17:2015

BS EN 62047-17:2015

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Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films

€316.00

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BS EN 62047-16:2015

BS EN 62047-16:2015

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Semiconductor devices. Micro-electromechanical devices Test methods for determining residual stresses of MEMS films. Wafer curvature and cantilever beam deflection

€193.00

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IEC 62047-17:2015

IEC 62047-17:2015

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Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films

€231.00

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IEC 62047-16:2015

IEC 62047-16:2015

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Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods

€44.00

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NF EN 62047-22, C96-050-22 (12/2014)

NF EN 62047-22, C96-050-22 (12/2014)

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Semiconductor devices - Micro-electromechanical devices - Part 22 : electromechanical tensile test method for conductive thin films on flexible substrates - Dispositifs à semiconducteurs

€95.67

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NF EN 62047-21, C96-050-21 (12/2014)

NF EN 62047-21, C96-050-21 (12/2014)

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Semiconductor devices - Micro-electromechanical devices - Part 21 : test method for Poisson's ratio of thin film MEMS materials - Dispositifs à semiconducteurs

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NF EN 62047-20, C96-050-20 (12/2014)

NF EN 62047-20, C96-050-20 (12/2014)

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Semiconductor devices - Micro-electromechanical devices - Part 20 : gyroscopes

€166.33

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PD CLC/TR 62258-4:2013

PD CLC/TR 62258-4:2013

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Semiconductor die products Questionnaire for users and suppliers

€316.00

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BS EN 62047-20:2014

BS EN 62047-20:2014

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Semiconductor devices. Micro-electromechanical devices Gyroscopes

€374.00

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BS EN 62047-21:2014

BS EN 62047-21:2014

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Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials

€193.00

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BS EN 62047-22:2014

BS EN 62047-22:2014

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Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates

€165.00

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