Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
€369.00
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
€88.00
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
€44.00
Semiconductor devices - Micro-electromechanical devices - Part 11 : test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems - Dispositifs à semiconducteurs
€95.67
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 19 : compas électroniques
€93.67
Semiconductor devices - Micro-electromechanical devices - Part 18 : bend testing methods of thin film materials - Dispositifs à semiconducteurs
Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
€117.00
Semiconductor devices. Micro-electromechanical devices Test method for coefficients of linear thermal expansion free-standing materials micro-electromechanical systems
€269.00
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
€193.00
Semiconductor devices. Micro-electromechanical devices Electronic compasses
€316.00
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
€127.00
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
€231.00
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
€325.00
Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers
€111.67
