Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
€35.00
International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
€134.00
Mechanical standardization of semiconductor devices -- Part 6-10: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Dimensions of P-VSON
€59.00
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
€50.00
Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing
€62.00
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
€60.00
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
€40.00
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
€47.00
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Mechanical standardization of semiconductor devices -- Part 3: General rules for the preparation of outline drawings of integrated circuits.
€107.00
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
€28.00
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
