Microcircuits. Microwave devices. Attenuators. General article sheets. - Dispositifs hyperfréquences
€117.00
Pin allocations for microprocessor systems using the IEC 60603-2 connector
€11.00
Electronic components. Semiconductor devices. Discrete devices and integrated circuits. Part 1 : general.
€153.00
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
€93.00
Mechanical standardization of semiconductor devices. Part 2: Dimensions
€523.00
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
€172.00
Thermal standardization on semiconductor packages - Part 2-2: 3D thermal simulation models of semiconductor packages for steady-state analysis - PBGA and FBGA packages
€108.00
Thermal standardization on semiconductor packages - Part 4: Thermal evaluation board specifications for fine pitch semiconductor packages
€87.00
Thermal standardization on semiconductor packages - Part 6-1: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points - Model creation method using a datasheet of semiconductor device
€61.00
Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module
€122.00
Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment
€76.00
Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric] (Withdrawn 1998)
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Method for Measuring MOSFET Saturated Threshold Voltage
Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)
