Standard Test Method for Trace Metallic Impurities in High Purity Copper by High-Mass-Resolution Glow Discharge Mass Spectrometer (Withdrawn 2020)
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Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array (Withdrawn 2020)
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) (Withdrawn 2022)
Standard Test Method for Determining Current Carrying Capacity of a Membrane Switch Circuit (Withdrawn 2023)
Standard Test Method for Determining the Effects of Atmospheric Pressure Variation on a Membrane Switch (Withdrawn 2023)
Standard Test Method for Submersion of a Membrane Switch (Withdrawn 2023)
Standard Test Method for Hosedown of a Membrane Switch (Withdrawn 2023)
Standard Test Methods for Resistivity of Semiconductor Materials (Withdrawn 2003)
Standard Test Methods for Conductivity Type of Extrinsic Semiconducting Materials (Withdrawn 2003)
Standard Specification for Aluminum Oxide Powder (Withdrawn 2023)
Standard Specification for Iron-Nickel and Iron-Nickel-Cobalt Alloys for Low Thermal Expansion Applications (Withdrawn 2024)
Standard Test Method for Determining the Shear Strength of the Bond between a Surface Mount Device (SMD) and Substrate in a Membrane Switch (Withdrawn 2023)
Standard Guide for Classifying the Degrees of Ingress of Dust and Water into a Membrane Switch (Withdrawn 2023)
Standard Specification for Iron-Nickel-Cobalt Sealing Alloy (Withdrawn 2024)
Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps (Withdrawn 2023)
