F01

ASTM F15-04(2022)

ASTM F15-04(2022)

Withdrawn Most Recent

Standard Specification for Iron-Nickel-Cobalt Sealing Alloy (Withdrawn 2024)

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ASTM F16-12(2022)

ASTM F16-12(2022)

Withdrawn Most Recent

Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps (Withdrawn 2023)

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ASTM F18-12(2022)

ASTM F18-12(2022)

Withdrawn Most Recent

Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices (Withdrawn 2023)

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ASTM F29-97(2022)

ASTM F29-97(2022)

Withdrawn Most Recent

Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications (Withdrawn 2024)

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ASTM F1595-00(2020)

ASTM F1595-00(2020)

Withdrawn Most Recent

Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches (Withdrawn 2023)

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ASTM F1689-05(2020)

ASTM F1689-05(2020)

Withdrawn Most Recent

Standard Test Method for Determining the Insulation Resistance of a Membrane Switch (Withdrawn 2023)

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ASTM F2964-12(2020)

ASTM F2964-12(2020)

Withdrawn Most Recent

Standard Test Method for Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device (Withdrawn 2023)

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ASTM F375-20

ASTM F375-20

Withdrawn Most Recent

Standard Specification for Integrated Circuit Lead Frame Material (Withdrawn 2023)

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ASTM F1466-20

ASTM F1466-20

Withdrawn Most Recent

Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications (Withdrawn 2024)

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ASTM F1689-02

ASTM F1689-02

Superseded Historical

Standard Test Method for Determining the Insulation Resistance of a Membrane Switch

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ASTM F1709-97

ASTM F1709-97

Superseded Historical

Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications

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ASTM F1708-02

ASTM F1708-02

Withdrawn Most Recent

Standard Practice for Evaluation of Granular Polysilicon by Meter-Zoner Spectroscopies (Withdrawn 2003)

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ASTM F1710-97

ASTM F1710-97

Superseded Historical

Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer

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ASTM F1711-96

ASTM F1711-96

Superseded Historical

Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe

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ASTM F1723-02

ASTM F1723-02

Withdrawn Most Recent

Standard Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy (Withdrawn 2003)

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