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ASTM F1709-97(2016)

ASTM F1709-97(2016)

Withdrawn Most Recent

Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications (Withdrawn 2023)

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ASTM F1710-08(2016)

ASTM F1710-08(2016)

Withdrawn Most Recent

Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer (Withdrawn 2023)

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ASTM F1844-97(2016)

ASTM F1844-97(2016)

Withdrawn Most Recent

Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage (Withdrawn 2023)

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ASTM F1845-08(2016)

ASTM F1845-08(2016)

Withdrawn Most Recent

Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer (Withdrawn 2023)

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ASTM F2771-10(2016)

ASTM F2771-10(2016)

Withdrawn Most Recent

Standard Test Method for Determining the Luminance Curve of an Electroluminescent Lamp at Ambient Conditions (Withdrawn 2023)

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ASTM F1896-16

ASTM F1896-16

Withdrawn Most Recent

Test Method for Determining the Electrical Resistivity of a Printed Conductive Material (Withdrawn 2023)

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ASTM F1662-16

ASTM F1662-16

Withdrawn Most Recent

Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch or Printed Electronic Device (Withdrawn 2023)

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ASTM F2592-16

ASTM F2592-16

Withdrawn Most Recent

Standard Test Method for Measuring the Force-Displacement of a Membrane Switch (Withdrawn 2023)

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ASTM F2750-16

ASTM F2750-16

Withdrawn Most Recent

Standard Test Method for Determining the Effects of Bending a Membrane Switch or Printed Electronic Device (Withdrawn 2023)

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ASTM F3152-16

ASTM F3152-16

Withdrawn Most Recent

Standard Test Method for Determining Abrasion Resistance of Inks and Coatings on Substrates Using Dry or Wet Abrasive Medium (Withdrawn 2023)

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ASTM F744M-16

ASTM F744M-16

Withdrawn Most Recent

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)

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ASTM F1711-96(2016)

ASTM F1711-96(2016)

Withdrawn Most Recent

Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method (Withdrawn 2023)

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ASTM F773M-16

ASTM F773M-16

Withdrawn Most Recent

Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023)

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ASTM F3166-16

ASTM F3166-16

Withdrawn Most Recent

Standard Specification for High-Purity Titanium Sputtering Target Used for Through-Silicon Vias (TSV) Metallization (Withdrawn 2023)

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ASTM F3192-16

ASTM F3192-16

Withdrawn Most Recent

Standard Specification for High-Purity Copper Sputtering Target Used for Through-Silicon Vias (TSV) Mettalization (Withdrawn 2023)

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