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ASTM F290-94(2020)

ASTM F290-94(2020)

Withdrawn Most Recent

Standard Specification for Round Wire for Winding Electron Tube Grid Laterals (Withdrawn 2024)

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ASTM F2112-02(2019)

ASTM F2112-02(2019)

Withdrawn Most Recent

Standard Terminology for Membrane Switches (Withdrawn 2023)

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ASTM F2187-02(2019)

ASTM F2187-02(2019)

Withdrawn Most Recent

Standard Test Method for Determining the Effect of Random Frequency Vibration on a Membrane Switch or Membrane Switch Assembly (Withdrawn 2023)

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ASTM F2188-02(2019)

ASTM F2188-02(2019)

Withdrawn Most Recent

Standard Test Method for Determining the Effect of Variable Frequency Vibration on a Membrane Switch or Membrane Switch Assembly (Withdrawn 2023)

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ASTM F2359-04(2019)

ASTM F2359-04(2019)

Withdrawn Most Recent

Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source (Withdrawn 2023)

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ASTM F2866-11(2019)

ASTM F2866-11(2019)

Withdrawn Most Recent

Standard Test Method for Flammability of a Membrane Switch in Defined Assembly (Withdrawn 2023)

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ASTM F83-71(2018)

ASTM F83-71(2018)

Withdrawn Most Recent

Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters (Withdrawn 2023)

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ASTM F85-76(2018)

ASTM F85-76(2018)

Withdrawn Most Recent

Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes (Withdrawn 2023)

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ASTM F219-96(2018)

ASTM F219-96(2018)

Withdrawn Most Recent

Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps (Withdrawn 2023)

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ASTM F458-13(2018)

ASTM F458-13(2018)

Withdrawn Most Recent

Standard Practice for Nondestructive Pull Testing of Wire Bonds (Withdrawn 2023)

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ASTM F459-13(2018)

ASTM F459-13(2018)

Withdrawn Most Recent

Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds (Withdrawn 2023)

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ASTM F487-13(2018)

ASTM F487-13(2018)

Withdrawn Most Recent

Standard Specification for Fine Aluminum–1 % Silicon Wire for Semiconductor Lead-Bonding (Withdrawn 2024)

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ASTM F996-11(2018)

ASTM F996-11(2018)

Withdrawn Most Recent

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics (Withdrawn 2023)

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ASTM F1269-13(2018)

ASTM F1269-13(2018)

Withdrawn Most Recent

Standard Test Methods for Destructive Shear Testing of Ball Bonds (Withdrawn 2023)

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ASTM F1893-18

ASTM F1893-18

Withdrawn Most Recent

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)

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