Standard Test Method for Trace Metallic Impurities in High Purity Copper by High-Mass-Resolution Glow Discharge Mass Spectrometer
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Standard Guide for Measuring Characteristics of Sapphire Substrates
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric) (Withdrawn 2009)
Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)
Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric]
Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] (Withdrawn 2009)
Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009)
Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric] (Withdrawn 2009)
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components [Metric]
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
Standard Specification for 42% Nickel-6% Chromium-Iron Sealing Alloy
Standard Specification for Chromium-Iron Sealing Alloys with 18 or 28 Percent Chromium
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
