Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
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Standard Test Method for Sag of Tungsten Wire
Standard Specification for Tungsten Wire for Electron Devices and Lamps
Standard Specification for Molybdenum Wire and Rod for Electronic Applications
Standard Specification for Molybdenum Flattened Wire for Electron Tubes
Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
Standard Test Method for Determining the Capacitance of a Membrane Switch
Standard Test Method for Determining Ink or Coating Adhesion on Plastic Substrates for Membrane Switch Applications
Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
Standard Test Method for Determining the Effects of Bending a Membrane Switch or Assembly
Standard Practice for Sample Preparation of Transparent Plastic Films used on Membrane Switch Overlays for Specular Gloss Measurements
Standard Test Method for Determining the Effectiveness of Membrane Switch ESD Shielding
Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
Standard Test Method for Flammability of a Membrane Switch in Defined Assembly
