Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
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Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
Standard Test Method for Silver Migration for Membrane Switch Circuitry
Standard Specification for Iron-Nickel and Iron-Nickel-Cobalt Alloys for Low Thermal Expansion Applications
Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Standard Specification for Iron-Nickel Sealing Alloys
Standard Specification for Tungsten-Rhenium Alloy Wire for Electron Devices and Lamps
Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
Standard Test Method for Surface Flaws in Tungsten Seal Rod and Wire
