Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
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Standard Terminology for Membrane Switches
Standard Test Method for Determining the Effect of Random Frequency Vibration on a Membrane Switch or Membrane Switch Assembly
Standard Test Method for Determining the Effect of Variable Frequency Vibration on a Membrane Switch or Membrane Switch Assembly
Standard Specification for 42% Nickel-6% Chromium-Iron Sealing Alloy
Standard Specification for Electronic Grade Alloys of Copper and Nickel in Wrought Forms
Standard Specification for Chromium-Iron Sealing Alloys with 18 or 28 Percent Chromium
Standard Specification for Round Wire for Winding Electron Tube Grid Laterals
Standard Specification for Integrated Circuit Lead Frame Material
Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications
Practice for Submersion of a Membrane Switch
Standard Test Method for Density of Fine Wire and Ribbon Wire for Electronic Devices
Standard Test Method for Measuring Diameter of Fine Wire by Weighing
Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices