F01

ASTM F1893-11

ASTM F1893-11

Superseded Historical

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

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ASTM F2112-02(2011)

ASTM F2112-02(2011)

Superseded Historical

Standard Terminology for Membrane Switches

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ASTM F2187-02(2011)

ASTM F2187-02(2011)

Superseded Historical

Standard Test Method for Determining the Effect of Random Frequency Vibration on a Membrane Switch or Membrane Switch Assembly

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ASTM F2188-02(2011)

ASTM F2188-02(2011)

Superseded Historical

Standard Test Method for Determining the Effect of Variable Frequency Vibration on a Membrane Switch or Membrane Switch Assembly

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ASTM F31-05(2010)

ASTM F31-05(2010)

Superseded Historical

Standard Specification for 42% Nickel-6% Chromium-Iron Sealing Alloy

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ASTM F96-77(2010)

ASTM F96-77(2010)

Superseded Historical

Standard Specification for Electronic Grade Alloys of Copper and Nickel in Wrought Forms

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ASTM F256-05(2010)

ASTM F256-05(2010)

Superseded Historical

Standard Specification for Chromium-Iron Sealing Alloys with 18 or 28 Percent Chromium

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ASTM F290-94(2010)

ASTM F290-94(2010)

Superseded Historical

Standard Specification for Round Wire for Winding Electron Tube Grid Laterals

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ASTM F375-89(2010)

ASTM F375-89(2010)

Superseded Historical

Standard Specification for Integrated Circuit Lead Frame Material

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ASTM F1466-99(2010)

ASTM F1466-99(2010)

Superseded Historical

Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications

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ASTM F1895-10a

ASTM F1895-10a

Superseded Historical

Practice for Submersion of a Membrane Switch

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ASTM F180-94(2010)e1

ASTM F180-94(2010)e1

Superseded Historical

Standard Test Method for Density of Fine Wire and Ribbon Wire for Electronic Devices

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ASTM F205-94(2010)e1

ASTM F205-94(2010)e1

Superseded Historical

Standard Test Method for Measuring Diameter of Fine Wire by Weighing

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ASTM F2592-10

ASTM F2592-10

Superseded Historical

Standard Test Method for Measuring the Force-Displacement of a Membrane Switch

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ASTM F980-10

ASTM F980-10

Superseded Historical

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

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