F01

ASTM F1372-93(2005) (R1999)

ASTM F1372-93(2005) (R1999)

Superseded Historical

Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components

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ASTM F1373-93(2005) (R1999)

ASTM F1373-93(2005) (R1999)

Superseded Historical

Standard Test Method for Determination of Cycle Life of Automatic Valves for Gas Distribution System Components

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ASTM F1374-92(2005) (R1999)

ASTM F1374-92(2005) (R1999)

Superseded Historical

Standard Test Method for Ionic/Organic Extractables of Internal Surfaces-IC/GC/FTIR for Gas Distribution System Components

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ASTM F1375-92(2005) (R1999)

ASTM F1375-92(2005) (R1999)

Superseded Historical

Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components

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ASTM F1376-92(2005)

ASTM F1376-92(2005)

Superseded Historical

Standard Guide for Metallurgical Analysis for Gas Distribution System Components

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ASTM F1394-92(2005)

ASTM F1394-92(2005)

Superseded Historical

Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves

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ASTM F1396-93(2005)

ASTM F1396-93(2005)

Superseded Historical

Standard Test Method for Determination of Oxygen Contribution by Gas Distribution System Components

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ASTM F1397-93(2005) (R1999)

ASTM F1397-93(2005) (R1999)

Superseded Historical

Standard Test Method for Determination of Moisture Contribution by Gas Distribution System Components

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ASTM F1398-93(2005)

ASTM F1398-93(2005)

Superseded Historical

Standard Test Method for Determination of Total Hydrocarbon Contribution by Gas Distribution System Components

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ASTM F1438-93(2005) (R1999)

ASTM F1438-93(2005) (R1999)

Superseded Historical

Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components

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ASTM F1467-99(2005)

ASTM F1467-99(2005)

Superseded Historical

Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

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ASTM F1684-99(2005)e1

ASTM F1684-99(2005)e1

Superseded Historical

Standard Specification for Iron-Nickel and Iron-Nickel-Cobalt Alloys for Low Thermal Expansion Applications

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ASTM F1997-99(2005) (R1999)

ASTM F1997-99(2005) (R1999)

Superseded Historical

Standard Test Method for Determining the Sensitivity (Teasing) of a Tactile Membrane Switch

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ASTM F2771-09

ASTM F2771-09

Superseded Historical

Standard Test Method for Determining the Luminance Curve of an Electroluminescent Lamp at Ambient Conditions

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ASTM F980-10e1

ASTM F980-10e1

Superseded Historical

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

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