F01

ASTM F44-16

ASTM F44-16

Superseded Historical

Standard Specification for Metallized Surfaces on Ceramic

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ASTM F7-95(2016)

ASTM F7-95(2016)

Superseded Historical

Standard Specification for Aluminum Oxide Powder

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ASTM F19-11(2016)

ASTM F19-11(2016)

Superseded Historical

Standard Test Method for Tension and Vacuum Testing Metallized Ceramic Seals

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ASTM F76-08(2016)

ASTM F76-08(2016)

Superseded Historical

Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

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ASTM F1684-06(2016)

ASTM F1684-06(2016)

Superseded Historical

Standard Specification for Iron-Nickel and Iron-Nickel-Cobalt Alloys for Low Thermal Expansion Applications

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ASTM F744M-10

ASTM F744M-10

Superseded Historical

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

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ASTM F773M-10

ASTM F773M-10

Superseded Historical

Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]

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ASTM F996-10

ASTM F996-10

Superseded Historical

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

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ASTM F1662-10

ASTM F1662-10

Superseded Historical

Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch

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ASTM F1895-10

ASTM F1895-10

Superseded Historical

Practice for Submersion of a Membrane Switch

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ASTM F1896-10

ASTM F1896-10

Superseded Historical

Test Method for Determining the Electrical Resistivity of a Printed Conductive Material

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ASTM F2771-10

ASTM F2771-10

Superseded Historical

Standard Test Method for Determining the Luminance Curve of an Electroluminescent Lamp at Ambient Conditions

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ASTM F2113-01(2007)

ASTM F2113-01(2007)

Superseded Historical

Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications

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ASTM F1680-07

ASTM F1680-07

Superseded Historical

Standard Test Method for Determining Circuit Resistance of a Membrane Switch

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ASTM F1681-07

ASTM F1681-07

Superseded Historical

Standard Test Method for Determining Current Carrying Capacity of a Conductor as Part of a Membrane Switch Circuit

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