Standard Test Method for Counting Preferentially Etched or Decorated Surface Defects in Silicon Wafers
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Standard Practice for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces
Standard Test Method for Determining the Effect of Variable Frequency Vibration on a Membrane Switch or Membrane Switch Assembly
Standard Test Method for Determining the Effect of Random Frequency Vibration on a Membrane Switch or Membrane Switch Assembly
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Standard Test Method for Calibration of Helium Leak Detectors by Use of Secondary Standards (Withdrawn 2008)
Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
Standard Practice for Determining Solderability of Thick Film Conductors (Withdrawn 2008)
Standard Practice for Specifying Thick-Film Pastes (Withdrawn 2008)
Standard Test Method for Measuring Adhesion Strength of Solderable Films to Substrates (Withdrawn 2008)
Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe
Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Reduction Glow Discharge Mass Spectrometer
Standard Practice for Determining Gettering Rate, Sorption Capacity, and Gas Content of Nonevaporable Getters in the Molecular Flow Region (Withdrawn 2008)
Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
