Standard Guide for Neutron Irradiation of Unbiased Electronic Components
This product is not for sale, please contact us for more information
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Standard Specification for Semiconductor Device Passivation Opening Layouts (Withdrawn 2007)
Standard Test Method for Thermal Stability Testing of Gallium Arsenide Wafers (Withdrawn 2008)
Standard Test Method for Calibration of Liquid-Borne Particle Counters for Submicrometer Particle Sizing (Withdrawn 2002)
Test Method for Oxidizable (Organic) Carbon on Wafer Surfaces (By Persulfate) (Withdrawn 2001)
Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications
Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction (Withdrawn 2003)
Standard Terminology of Silicon Technology (Withdrawn 2003)
Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric]
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Test Methods for Destructive Shear Testing of Ball Bonds
Specification for Nickel Alloy Cathode Sleeves for Electron Devices (Withdrawn 1992)
Test Method for Nonvolatile Residue of Volatile Cleaning Solvents Using the Solvent Purity Meter (Withdrawn 1987)
Method for Measurement of Oxide Thickness on Silicon Wafers and Metallization Thickness by Multiple-Beam Interference (Tolansky Method) (Withdrawn 1993)
