IEC 62433-1:2019 EMC IC modelling - Part 1: General modelling framework
€389.00
IEC 62433-1:2019/COR1:2020 Corrigendum 1 - EMC IC modelling - Part 1: General modelling framework
This product is not for sale, please contact us for more information
IEC 63055:2016 Format for LSI-Package-Board Interoperable design
€551.00
IEC 62090:2017 Product package labels for electronic components using bar code and two-dimensional symbologies
€302.00
Integrated circuits. Measurement of electromagnetic immunity radiated immunity. IC stripline method
€269.00
Draft BS EN 61967-1 Ed.3.0 Integrated circuits - Measurement of electromagnetic emissions Part 1: General conditions and definitions
€23.00
Draft BS EN 62132-1 Ed.3.0 Integrated circuits - Measurement of electromagnetic immunity Part 1: General conditions and definitions
IEC 60748-23-1:2002 Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification
€441.00
IEC 60748-23-4:2002 Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification
€133.00
IEC 60748-23-3:2002 Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report
IEC 60748-23-2:2002 Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
€470.00
IEC 60748-23-5:2003 Semiconductor devices - Integrated circuits, Part 23-5: Hybrid integrated circuits and film structures - Manufacturing line certification - Procedure for qualification approval
IEC 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
IEC TR 61967-4-1:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 O/150 O direct coupling method - Application guidance to IEC 61967-4
€342.00
IEC 60748-4-3:2006 Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)