Semiconductor devices and integrated circuits; general principles of measuring methods revision of publication 147-2 (continued): voltage-reference and voltage-regulator diodes, varbiable-capacitance diodes
€34.30
General principles of measuring methods; new measuring methods intended to be introduced in IEC publication 60147-2
€48.79
Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits
€269.00
Amendments to the generic specification for semiconductor devices and integrated circuits
Amendments to the generic specification for semiconductor devices and integrated circuits; sampling requirements for small lots
Electrical measuring methods for integrated circuits; chip select access time
Electrical measuring methods for integrated circuits; read access time
Electrical measuring methods for integrated circuits; write recovery time
Electrical measuring methods for integrated circuits; common-mode input voltage range
Electrical measuring methods for integrated circuits; short-circuit output current I
Electrical measuring methods for integrated circuits; channel separation, crosstalk (for multiple amplifiers)
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fusible link programmable read only memories, silicon monolithic integrated circuits
Interface circuits; essential ratings and characteristics of analogue-digital and digital-analogue linear converters
€41.78
Integrated film circuits; terms and definitions
Electrical measuring methods for integrated circuits; differential input resistance r for operational amplifiers
