31.200 : Integrated circuits. Microelectronics

ASTM F773M-96(2003) (R1996)

ASTM F773M-96(2003) (R1996)

Superseded Historical

Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]

This product is not for sale, please contact us for more information

View more
ASTM F744M-97(2003) (R1997)

ASTM F744M-97(2003) (R1997)

Superseded Historical

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

This product is not for sale, please contact us for more information

View more
ASTM E1855-10

ASTM E1855-10

Superseded Historical

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

This product is not for sale, please contact us for more information

View more
ASTM E1855-15

ASTM E1855-15

Superseded Historical

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

This product is not for sale, please contact us for more information

View more
25/30528765 DC:2025

25/30528765 DC:2025

Active Most Recent

Draft BS EN 62020-1/A1 Electrical accessories - Residual current monitors (RCMs) Part 1: RCMs for household and similar uses

€23.00

View more
NF EN 61967-8, C96-260-8 (03/2012)

NF EN 61967-8, C96-260-8 (03/2012)

Active Most Recent

Circuits intégrés - Mesure des émissions électromagnétiques - Partie 8 : mesure des émissions rayonnées - Méthode de la ligne TEM à plaques (stripline) pour CI

€95.67

View more