31.200 : Integrated circuits. Microelectronics

DIN 41850-2:1985-09

DIN 41850-2:1985-09

Withdrawn Most Recent

Film and hybrid integrated circuits; materials, methods for the assessment of conductive pastes

€41.78

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DIN 41850-3:1985-09

DIN 41850-3:1985-09

Withdrawn Most Recent

Integrated film circuits; methods for the assessment of dielectric pastes

€41.78

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DIN IEC 47A(CO)141:1985-09

DIN IEC 47A(CO)141:1985-09

Withdrawn Most Recent

Digital circuits; measuring method for output enable (disable) time (for three-state outputs)

€34.30

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DIN IEC 47A(CO)149:1985-09

DIN IEC 47A(CO)149:1985-09

Withdrawn Most Recent

Integrated analogue circuits; additional methods of measurement for analogue switching circuits, static on-state resistance and harmonic distortion; identical with IEC 47A(Central Office)149

€34.30

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BS CECC 00013:1985

BS CECC 00013:1985

Withdrawn Most Recent

Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice

€269.00

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BS CECC 90300:1985

BS CECC 90300:1985

Superseded Historical

Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits

€269.00

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DIN 45940-12*CECC 90200:1985-08

DIN 45940-12*CECC 90200:1985-08

Withdrawn Most Recent

Harmonized system of quality assessment for electronic components; sectional specification: analogue monolithic integrated circuits

€98.32

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DIN 45941-1101*CECC 63201:1985-08

DIN 45941-1101*CECC 63201:1985-08

Withdrawn Most Recent

Harmonized system of quality assessment for electronic components; blank detail specification: film and hybrid integrated circuits (capability approval)

€41.78

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DIN 45903*CECC 00013:1985-08

DIN 45903*CECC 00013:1985-08

Withdrawn Most Recent

Harmonized system of quality assessment for electronic components; basic specification: scanning electron microscope inspection of semiconductor dice

€69.91

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DIN 45904*CECC 00012:1985-08

DIN 45904*CECC 00012:1985-08

Superseded Historical

Harmonized system of quality assessment for electronic components; basic specification: radiographic inspection of electronic components

€48.79

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BS 9970-0:1985

BS 9970-0:1985

Superseded Historical

Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification

€269.00

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BS CECC 90107:1985

BS CECC 90107:1985

Superseded Historical

Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL FAST circuits

€269.00

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NF C96-883 (04/1985)

NF C96-883 (04/1985)

Withdrawn Most Recent

Microstructures - Sélection des circuits intégrés par élimination des défauts de jeunesse - Prescriptions générales

€166.33

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DIN 45940-11*CECC 90100:1985-04

DIN 45940-11*CECC 90100:1985-04

Superseded Historical

Harmonized system of quality assessment for electronic components; sectional specification: digital monolithic integrated circuits

€116.64

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DIN 45940-1103*CECC 90103:1985-03

DIN 45940-1103*CECC 90103:1985-03

Superseded Historical

Harmonized system of quality assessment for electronic components; family specification: digital integrated TTL-Low Power Schottky circuits; series 54 LS, 64 LS, 74 LS, 84 LS

€77.20

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