Method for Identification of Metal Particulate Contamination Found in Electronic and Microelectronic Components and Systems Using the Ring Oven Technique, With Spot Tests (Withdrawn 1994)
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Practice for Measuring Dose Rate Response of Linear Integrated Circuits
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL-SCHOTTKY circuits, series 54S, 64S, 74S, 84S
€193.00
Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits
€374.00
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL advanced low power SCHOTTKY digital integrated circuits series 54 ALS, 74 ALS
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL FAST digital integrated circuits series 54 F, 74 F
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL advanced SCHOTTKY digital integrated circuits series 54 AS, 74 AS
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Semiconductor die products - Minimum requirements for procurement and use - Part 1: General requirements; Mechanical, material and connectivity (IEC 47/1575/CD:2001), text in English
€105.42
Discrete semiconductor devices - Part 16-10: Technology approval schedule for monolithic microwave integrated circuits (IEC 47E/197/CD:2001)
€140.00
IECEE Test Report Form 62443-2-4D
€638.00
International Electrotechnical Vocabulary - Chapter 521: Semiconductor devices and integrated circuits (IEC 60050-521:1984 and IEC 1/1775/CDV:1999)
€134.02
Terminology, essential ratings and characteristics, and measuring methods for integrated circuit microwave frequency converters (IEC 47E/166/CDV:2000)
€111.40
IEC 62132-8:2026 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
€186.00
