Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method (IEC 47A/811/CD:2009)
€105.42
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC Stripline method (IEC 47A/810/CD:2009)
Semiconductor devices - Part 16-3: Microwave integrated circuits; Frequency converters (IEC 60747-16-3:2002); German version EN 60747-16-3:2002.
€122.34
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method (IEC 61967-6:2002); German version EN 61967-6:2002.
Semiconductor die products - Part 1: Requirements for procurement and use (IEC 62258-1:2005); German version EN 62258-1:2005.
Semiconductor die products - Part 2: Exchange data formats (IEC 47/1651/CD:2002)
€179.53
Semiconductor die products - Part 1: Requirements for procurement and use (IEC 47/1650/CD:2002)
Microstructures - Certification de ligne de fabrication pour MCM (Multi Chip Modules) (QML)
€213.00
IEC 62215-3:2013 Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
€302.00
IEC TS 62132-9:2014 Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
€244.00
IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
Circuits intégrés - Mesure de l'immunité électromagnétique - Partie 8 : mesure de l'immunité rayonnée - Méthode de la ligne TEM à plaques pour circuit intégré
€111.67
Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
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Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric]
Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
