QML for integrated circuits - Guide 2: Guide for methodology and failure analysis (IEC 47A/423/CD:1996)
€56.17
Blank detail specification for Programmable Logic Devices (PLDs) (IEC 47A/420/CD:1996)
€91.03
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic Probe method (IEC 47A/720/CD:2005)
€84.58
Semiconductor die products - Part 6: Requirements for information concerning thermal simulation (IEC 47/1808/CD:2005)
€63.27
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation (IEC 47/1807/CD:2005)
€69.91
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ohm/150 Ohm direct coupling method (IEC 47A/693/CDV:2004); German version EN 61967-4:2002/prA1:2004
€48.79
Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage (IEC 47/1750/CD:2004)
€140.00
Proposal for amendment to draft publication IEC 60748-5 - Chapter V: Acceptance and reliability (IEC 47A/403/CDV:1995)
€41.78
Sectional specification: Film and hybrid integrated circuits; German version EN 163100:1991
Blank detail specification: Film and hybrid integrated circuits; German version EN 163101:1991
Integrated film circuits - Materials - Part 1: Substrates (Proposal for a European Standard)
Integrated film circuits - Materials - Part 2: Methods for the assessment of conductive pastes (Proposal for a European Standard)
Integrated film circuits - Materials - Part 3: Methods for the assessment of dielectric pastes (Proposal for a European Standard)
Integrated film circuits - Materials - Part 4: Methods for judgement of thick film resistor compositions (Proposal for a European Standard)
QML for integrated circuits (IEC 47A/421/CDV:1996)
€105.42
