Mobile ion tests - Bias temperature stress (BTS) - Triangular voltage sweep (TVS) (IEC 47/1904/CD:2007)
€63.27
Semiconductor die products - Part 2: Exchange data formats (IEC 47/2023/CDV:2009); English version FprEN 62258-2:2009
€185.05
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 47E/335/CD:2007)
€41.78
Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers (IEC 60747-16-2:2001 + IEC 47E/296/CD:2006)
€111.40
Integrated Circuits - Measurement of Electromagnetic Immunity, 150 kHz to 1 GHz - Part 2: Measurement of Radiated Immunity - Tem-Cell and Wideband Tem-Cell Method (IEC 47A/748/CD:2006)
€98.32
Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk Current Injection (BCI), 10 kHz to 1 GHz (IEC 47A/670/CD:2003)
€84.58
Semiconductors devices - Integrated circuits - Part 4-3: Interface integrated circuits; Dynamic criteria for Analogue-Digital Converters (ADC) (IEC 47A/667/CD:2003)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions; 1 ohm/150 ohm direct coupling method (IEC 61967-4:2002); German version EN 61967-4:2002.
€105.42
Integrated circuits - Measurement of electromagnetic emissions; 150 kHz to 1 GHz - Part 3: Measurement of radiated emissions - Surface scan method (IEC 47A/674/CD:2003)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM-cell method (IEC 47A/673/CD:2003)
Integrated Circuits - I/0 Interface Model for Integrated Circuits (IMIC) (IEC 47A/704/CD:2004)
€162.06
Integrated circuit microwave frequency prescalers (IEC 47E/84/CD:1997)
€77.20
Amendments to IEC 60748-11:1990 and to its Amendment 1:1995 (IEC 47A/497/CDV:1997)
QML for integrated circuits - Guide 1: Demonstration vehicles (IEC 47A/422/CD:1996)
