Additif 1 à la publication UTE C 96-030 de juillet 1988
€34.00
Additif 3 à la publication UTE C 86-218 de septembre 1986
€237.33
Composants électroniques - Amplificateurs opérationnels intégrés - Recueil de spécifications particulières.
€333.00
Additif 1 à la publication UTE C 86-254 d'août 1988
€95.67
Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations
This product is not for sale, please contact us for more information
Semiconductor devices; amendment to the sectional specification for integrated circuits; subgroups B5, C5, C7; identical with IEC 47(Central Office)1037
€34.30
Semiconductor devices; supplement to the sectional specification for integrated circuits; correlated measurements; identical with IEC 47/47A(Central Office)1049/173
Analogue integrated circuits; measuring methods; common-mode input voltage range; identical with IEC 47A(Central Office)168
Semiconductor devices; sectional specification for integrated film and hybrid circuits; qualification approval procedure; identical with IEC 47A(Central Office)181
€48.79
Digital integrated circuits; terms and description of test patterns for memory testing; identical with IEC 47(Central Office)1044
€41.78
Additif 2 à la publication UTE C 86-218 de septembre 1986
Integrated film and hybrid circuits; blank detail specifcation; capability approval procedure; identical with IEC 47A(Central Office)184
IEC quality assessment system for electronic components; blank detail specification; microprocessor integrated circuits; identical with IEC 47A(Central Office)191
€63.27
Composants électroniques - Système CENELEC d'assurance de la qualité des circuits intégrés logiques TTL schottky - Faible consommation - Spécification de famille
Composants électroniques - Système CENELEC d'assurance de la qualité des circuits intégrés logiques TTL standard - Spécification de famille
