Film and hybrid integrated circuits Procedure for qualification approval
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Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits
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Definitions of Terms Relating to Relating to Photomasking Technology for Microelectronics (Withdrawn 1992)
Guide for Analysis of Latchup Susceptibility in Bipolar Integrated Circuits (Withdrawn 1987)
Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]
BS EN IEC 62228-5 Integrated circuits - EMC evaluation of transceivers Part 5: Ethernet
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BS EN IEC 63664 Integrated Circuits - Electronic fuses for low voltage automotive power distribution networks
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BS EN IEC 62132-8 Integrated circuits - Measurement of electromagnetic immunity Part 8: radiated IC stripline method
Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
