Specification for quartz crystal oscillators of assessed quality: generic data and methods of test
€404.00
Specification for capability approval of quartz crystal units: generic data
€269.00
Specification for quartz oscillator crystal units General requirements and methods of test
Quartz crystal units of assessed quality Guidelines for the use
€316.00
Dimensions of piezoelectric devices Specification for standard outlines and pin connections quartz crystal units
Dimensions of piezoelectric devices Specification for standard outlines filters
Lithium tantalate and lithium niobate crystals for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
Test-fixture of surface mounting quartz crystal units
€193.00
Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz and SAW oscillators. Application guide
Surface Acoustic Wave (SAW) and Bulk (BAW) duplexers of assessed quality Guidelines for the use
Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules
Waveguide type dielectric resonators General information and test conditions. Measurement method of conductivity at interface between conductor layer substrate microwave frequency
Piezoelectric and dielectric devices for frequency control selection. Glossary Materials surface acoustic wave (SAW)
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
