31.140 : Piezoelectric devices

NF EN 60679-1, C93-620-1 (11/2017)

NF EN 60679-1, C93-620-1 (11/2017)

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Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1 : generic specification

€117.00

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BS IEC 62047-30:2017

BS IEC 62047-30:2017

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Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics MEMS piezoelectric thin film

€269.00

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BS EN 62884-1:2017

BS EN 62884-1:2017

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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement

€374.00

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IEC 62047-30:2017

IEC 62047-30:2017

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Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film

€127.00

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NF EN 60444-8, C93-621-8 (09/2017)

NF EN 60444-8, C93-621-8 (09/2017)

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Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

€82.00

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NF EN 62884-1, C93-684-1 (09/2017)

NF EN 62884-1, C93-684-1 (09/2017)

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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1 : basic methods for the measurement

€156.67

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IEC 62884-2:2017

IEC 62884-2:2017

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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

€176.00

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DIN EN 61240:2017-08

DIN EN 61240:2017-08

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Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (IEC 61240:2016); German version EN 61240:2017).

€98.32

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IEC 60679-1:2017

IEC 60679-1:2017

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Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

€286.00

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IEC 62884-1:2017

IEC 62884-1:2017

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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement

€418.00

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BS EN 60444-8:2017

BS EN 60444-8:2017

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Measurement of quartz crystal unit parameters Test fixture for surface mounted units

€193.00

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DIN EN 60758:2017-04

DIN EN 60758:2017-04

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Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2016); German version EN 60758:2016.

€167.66

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BS EN 61240:2017

BS EN 61240:2017

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Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules

€269.00

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BS EN 62276:2016

BS EN 62276:2016

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Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

€355.00

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IEC 60050-561:2014/AMD1:2016

IEC 60050-561:2014/AMD1:2016

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Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

€11.00

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