Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
€88.00
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
€127.00
Synthetic quartz crystal. Specifications and guidelines for use
€374.00
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (IEC 62575-1:2015); German version EN 62575-1:2016
€128.22
Synthetic quartz crystal - Specifications and guidelines for use
€369.00
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (IEC 61338-1-5:2015); German version EN 61338-1-5:2015
€105.42
Filtres radiofréquences (RF) à ondes acoustiques de volume (OAV) sous assurance de la qualité - Partie 1 : spécification générique
€138.00
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
€316.00
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3 : metal enclosure - Dispositifs piézoélectriques à montage en surface pour la commande et le choix de la fréquence
€82.00
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines terminal lead connections Metal enclosures
€269.00
Surface acoustic wave (SAW) filters of assessed quality - Part 1 : generic specification
€128.67
Surface acoustic wave (SAW) filters of assessed quality Generic specification
Résonateurs diélectriques à modes guidés - Partie 1-5 : informations générales et conditions d'essais - Méthode de mesure de la conductivité au niveau de l'interface entre une couche conductrice et un substrat diélectrique fonctionnant aux hyperfréquences
€111.67
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
€286.00
Waveguide type dielectric resonators General information and test conditions. Measurement method of conductivity at interface between conductor layer substrate microwave frequency
