Surface mounted piezoelectric devices for frequency control and selection. Standard outlines terminal lead connections Ceramic enclosures
€404.00
Measurement of quartz crystal unit parameters drive level dependence (DLD)
€269.00
Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary oscillators
€193.00
Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Generic specification
€316.00
Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Guidelines for the use
Quartz crystal units of assessed quality Crystal with thermistors
BS EN IEC 60444-11. Measurement of quartz crystal unit parameters Part 11. Standard method for the determination load resonance frequency fL and effective capacitance CLeff using automatic network analyzer techniques error correction
€23.00
Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval
€165.00
Measurement of quartz crystal unit parameters Phase offset method for measurement motional capacitance units
Measurement of quartz crystal unit parameters Methods for the determination equivalent electrical using automatic network analyzer techniques and error correction
€374.00
Measurement of quartz crystal unit parameters Basic method for the measurement two-terminal units up to 200 MHz by phase technique in a p-network with compensation parallel capacitance C0
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval)
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Measurement of quartz crystal unit parameters Method for the measurement load resonance frequency fL, resistance RL and calculation other derived values units, up to 30 MHz
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
