Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Short-term frequency stability test methods
€269.00
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : short-term frequency stability test methods
€111.67
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods
€127.00
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
€193.00
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
€88.00
Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
€176.00
Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Quartz crystal units of assessed quality Crystal with thermistors
Quartz crystal units of assessed quality - Part 4 : crystal units with thermistors
€82.00
Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
€23.00
Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric materials. Synthetic quartz crystal
€165.00
Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric materials. Single crystal wafers surface acoustic wave (SAW)
