Measurement of quartz crystal unit parameters Test fixture for surface mounted units
€193.00
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
€374.00
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
€355.00
Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules
€269.00
Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Guidelines for the use
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Frequency aging test methods
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Short-term frequency stability test methods
Piezoelectric sensors Generic specifications
Piezoelectric sensors Chemical and biochemical
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval)
Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
Piezoelectric, dielectric and electrostatic devices associated materials for frequency control, selection detection. Glossary Piezoelectric sensors
€165.00
Piezoelectric sensors Physical
€316.00
