BS EN 60679-1 AMD1. Quartz crystal controlled oscillators of assessed quality. Part 1. Generic specification
€23.00
Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
€355.00
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics MEMS piezoelectric thin film
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Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
€193.00
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Piezoelectric properties of ceramic materials and components Terms definitions
Piezoelectric properties of ceramic materials and components Methods measurement. Low power
Piezoelectric properties of ceramic materials and components Methods measurement. High power
Glossary of electrotechnical, power, telecommunication, electronics, lighting and colour terms. Terms particular to telecommunications electronics Oscillations, signals related devices
€404.00
Safety of transportable motor-operated electric tools General requirements
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
BS EN IEC 60122-2. Quartz crystal units of assessed quality Part 2. Guide to the use
