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IEC 60444-11:2026
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
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Summary
IEC 60444-11:2026 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.
This edition includes the following significant technical changes with respect to the previous edition:
a) key content of withdrawn IEC TR 60444-4 is reproduced as Annex A;
b) some formulae in the first edition have been corrected.
This edition includes the following significant technical changes with respect to the previous edition:
a) key content of withdrawn IEC TR 60444-4 is reproduced as Annex A;
b) some formulae in the first edition have been corrected.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 04/22/2026 |
| Release Date | 04/22/2026 |
| Edition | 2 |
| Page Count | 27 |
| Themes | Quality assurance |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
07/10/2010
Superseded
Historical
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