Specification in the Quality Assessment System for Electronic Components (IECQ); sectional specification; quartzcrystal controlled oscillators; identical with IEC 49(Secretariat)252
€98.32
Specification in the quality assessment system for electronic components (IECQ); generic specification: quartz crystal controlled oscillators; identical with IEC 49(Secretariat)245
€140.00
Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification
€286.00
Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions
€127.00
Piezoelectric filters; part 2: guide to the use of piezoelectric filters; section 2: piezoelectric ceramic filters (revision of IEC 368B); identical with IEC 49(Secretariat)244
€69.91
Piezoelectric filters; part 1: general information, standard values and test conditions; identical with IEC 60368-1:1992
€77.20
Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 1: basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network; identical with IEC 60444-1:1986
€84.58
Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 3: basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a -network with compensation of the parallel capacitance C; identical with IEC 60444-3:1986
€63.27
Measurement of Drive Level Dependence (DLD) of crystal units; identical with IEC 49(Secretariat)193
€56.17
Methods for the measurement of quartz crystal devices for the determination of equivalent electrical parameters using automatic network analyser techniques and error correction; identical with IEC 49(Central Office)248
€111.40
Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 2: phase offset method for measurement of motional capacitance of quartz crystal units; identical with IEC 60444-2:1980
€48.79
Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 4: method for the measurement of load resonance frequency f, load resonance resistance R and the calculation of other derived values of quartz crystal units, up to 30 MHz; identical with IEC 60444-4:1988
Quartz crystal units for frequency control and -selection; part 1: standard values and test conditions; identical with IEC 60122-1:1976
Quartz crystal units for frequency control and selection; part 2: guide to use of quartz crystal units for frequency control and selection; section one: quartz crystal units for microprocessor clock supply; amendment 1 to IEC 60122-2-1; identical with IEC 49(Central Office)245
€41.78
International electrotechnical vocabulary; part 561: piezoelectric devices for frequency control and selection; identical with IEC 60050-561:1991
