BS EN IEC 60444-11 Measurement of quartz crystal unit parameters Part 11: Standard method for the determination load resonance frequency fL and effective capacitance CLeff using automatic network analyzer techniques error correction
€23.00
BS EN IEC 63541 Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications - Specifications and measuring method
IEC TS 61994-3:2021 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric, dielectric and electrostatic oscillators
€133.00
IEC TS 61994-5:2023 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
€46.00
IEC 62604-2:2017 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
€186.00
IEC 60122-1:2002/AMD1:2017 Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 63041-1:2017 Piezoelectric sensors - Part 1: Generic specifications
IEC 63041-2:2017 Piezoelectric sensors - Part 2: Chemical and biochemical sensors
€93.00
IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
IEC 61837-2:2018 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
€470.00
IEC TS 61994-4-4:2018 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
IEC TS 61994-4-1:2018 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
IEC 62047-33:2019 Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
IEC 62047-34:2019 Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
IEC 62047-36:2019 Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
