Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
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Standard Test Method for Determining the Tactile Ratio of a Membrane Switch
Standard Test Method for Thermal Stability Testing of Gallium Arsenide Wafers
Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
Standard Test Method for Dimensions of Notches on Silicon Wafers
Standard Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques
Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)
Standard Specification for Nickel-Clad and Nickel-Plated Steel Strip for Electron Tubes
Standard Specification for Nickel Strip for Electron Tubes
Standard Specification for Carbonized Nickel Strip and Carbonized Nickel-Plated and Nickel-Clad Steel Strip for Electron Tubes
Standard Specification for Aluminum Oxide Powder
Standard Specification for Iron-Nickel-Cobalt Sealing Alloy
Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps
Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Standard Test Method for Tension and Vacuum Testing Metallized Ceramic Seals
